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Calibrated Photodiodes


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Calibrated Photodiodes

Thorlabs offers five photodiodes, with NIST traceable calibration, that ship from stock. These include one Indium Gallium Arsenide (InGaAs), two Silicon (Si), and two Germanium (Ge) photodiodes.

Mounted and Unmounted Detectors
Unmounted Photodiodes (150 - 2600 nm)
Mounted Photodiodes (150 - 1800 nm)
Calibrated Photodiodes (350 - 1800 nm)
Photoconductors (1 - 4.8 µm)

Calibration Features:

  • Responsivity Measured Every 10 nm Over the Spectral Range of the Photodiode
  • Measurement Uncertainty ±5%
  • NIST Traceable

Each photodiode comes with its own data table and graph of the responsivity vs wavelength.

The responsivity of a particular photodiode varies from lot to lot. Due to this, the photodiode you receive may have a slightly different response than what is represented below, but will include calibration data. To the right, a graph for the FDS1010 photodiode shows how significantly you can expect the response to vary. Data was collected from 104 photodiodes. Minimum, Average, and Maximum responsivity was calculated at each data point and has been plotted.

Please note that inhomogeneities at the edges of the active area of the detector can generate unwanted capacitance and resistance effects that distort the time-domain response of the photodiode output. Thorlabs therefore recommends that the incident light on the photodiode is well centered on the active area. This can be accomplished by placing a focusing lens or pinhole in front of the detector element.

Photodiode Specifications

Item #FGA21-CALFDS100-CALFDS1010-CALFDG03-CALFDG05-CAL
MaterialInGaAsSiSiGeGe
Wavelength Range800 - 1700 nm350 - 1100 nm400 - 1100 nm800 - 1800 nm800 - 1800 nm
Active Area (Dimensions)3.1 mm2 (Ø2 mm) 13.0 mm2 (3.6 mm x 3.6 mm) 94.1 mm2 (9.7 mm x 9.7 mm) 7.1 mm2 (Ø3 mm) 19.6 mm2 (Ø5 mm)
Peak Wavelength1490 nm985 nm985 nm1550 nm1550 nm
Rise Time (Fall Time)
RL=50 Ω
66 ns (66 ns)
@ 0 V
10 ns (10 ns)
@ 20 V
45 ns (45 ns)
@ 5 V
500 ns (500 ns)
@ 3 V
220 ns (220 ns)
@ 5 V
NEP3.0x10-14 W/√Hz
@ 1550 nm
1.2x10-14 W/√Hz
@ 900 nm
5.5x10-14 W/√Hz
@ 900 nm
1.0x10-12 W/√Hz
@ 1550 nm
4.0x10-12 W/√Hz
@ 1550 nm
Dark Current 200 nA max (1 V)20 nA max (20 V) 0.6 μA max (5 V) 4.0 μA max (1 V) 40 μA max (3 V)
PackageØ0.36" Can Ø0.36" Can 0.45" x 0.52"
Ceramic Wafer
Ø0.36" Can 0.275" x 0.310"
Ceramic Wafer
Max Bias Voltage3 V25 V20 V3 V5 V
Junction Capacitance
RL=50 Ω
40 pF (@ 10 V)375 pF (@ 5 V)4 pF (@ 1 V)3000 pF (@ 5 V)500 pF (@ 0 V)

Photodiode Tutorial

Theory of Operation

A junction photodiode is an intrinsic device that behaves similarly to an ordinary signal diode, but it generates a photocurrent when light is absorbed in the depleted region of the junction semiconductor. A photodiode is a fast, highly linear device that exhibits high quantum efficiency based upon the application and may be used in a variety of different applications.

It is necessary to be able to correctly determine the level of the output current to expect and the responsivity based upon the incident light. Depicted in Figure 1 is a junction photodiode model with basic discrete components to help visualize the main characteristics and gain a better understanding of the operation of Thorlabs' photodiodes.

Equation 1
Photodiode Circuit Diagram
Figure 1: Photodiode Model

Photodiode Terminology

Responsivity
The responsivity of a photodiode can be defined as a ratio of generated photocurrent (IPD) to the incident light power (P) at a given wavelength:

Equation 2

Modes of Operation (Photoconductive vs. Photovoltaic)
A photodiode can be operated in one of two modes: photoconductive (reverse bias) or photovoltaic (zero-bias). Mode selection depends upon the application's speed requirements and the amount of tolerable dark current (leakage current).

Photoconductive
In photoconductive mode, an external reverse bias is applied, which is the basis for our DET series detectors. The current measured through the circuit indicates illumination of the device; the measured output current is linearly proportional to the input optical power. Applying a reverse bias increases the width of the depletion junction producing an increased responsivity with a decrease in junction capacitance and produces a very linear response. Operating under these conditions does tend to produce a larger dark current, but this can be limited based upon the photodiode material. (Note: Our DET detectors are reverse biased and cannot be operated under a forward bias.)

Photovoltaic
In photovoltaic mode the photodiode is zero biased. The flow of current out of the device is restricted and a voltage builds up. This mode of operation exploits the photovoltaic effect, which is the basis for solar cells. The amount of dark current is kept at a minimum when operating in photovoltaic mode.

Dark Current
Dark current is leakage current that flows when a bias voltage is applied to a photodiode. When operating in a photoconductive mode, there tends to be a higher dark current that varies directly with temperature. Dark current approximately doubles for every 10 °C increase in temperature, and shunt resistance tends to double for every 6 °C rise. Of course, applying a higher bias will decrease the junction capacitance but will increase the amount of dark current present.

The dark current present is also affected by the photodiode material and the size of the active area. Silicon devices generally produce low dark current compared to germanium devices which have high dark currents. The table below lists several photodiode materials and their relative dark currents, speeds, sensitivity, and costs.

MaterialDark CurrentSpeedSensitivityaCost
Silicon (Si)LowHigh Speed400 - 1000 nmLow
Germanium (Ge)HighLow Speed900 - 1600 nmLow
Gallium Phosphide (GaP)LowHigh Speed150 - 550 nmModerate
Indium Gallium Arsenide (InGaAs)LowHigh Speed800 - 1800 nmModerate
Indium Arsenide Antimonide (InAsSb)HighLow Speed1000 - 5800 nmHigh
Extended Range Indium Gallium Arsenide (InGaAs)HighHigh Speed1200 - 2600 nmHigh
Mercury Cadmium Telluride (MCT, HgCdTe)HighLow Speed2000 - 5400 nmHigh
  • Approximate

Junction Capacitance
Junction capacitance (Cj) is an important property of a photodiode as this can have a profound impact on the photodiode's bandwidth and response. It should be noted that larger diode areas encompass a greater junction volume with increased charge capacity. In a reverse bias application, the depletion width of the junction is increased, thus effectively reducing the junction capacitance and increasing the response speed.

Bandwidth and Response
A load resistor will react with the photodetector junction capacitance to limit the bandwidth. For best frequency response, a 50 Ω terminator should be used in conjunction with a 50 Ω coaxial cable. The bandwidth (fBW) and the rise time response (tr) can be approximated using the junction capacitance (Cj) and the load resistance (RLOAD):

Equation 3

Terminating Resistance
A load resistance is used to convert the generated photocurrent into a voltage (VOUT) for viewing on an oscilloscope:

Equation 4

Depending on the type of the photodiode, load resistance can affect the response speed. For maximum bandwidth, we recommend using a 50 Ω coaxial cable with a 50 Ω terminating resistor at the opposite end of the cable. This will minimize ringing by matching the cable with its characteristic impedance. If bandwidth is not important, you may increase the amount of voltage for a given light level by increasing RLOAD. In an unmatched termination, the length of the coaxial cable can have a profound impact on the response, so it is recommended to keep the cable as short as possible.

Shunt Resistance
Shunt resistance represents the resistance of the zero-biased photodiode junction. An ideal photodiode will have an infinite shunt resistance, but actual values may range from the order of ten Ω to thousands of MΩ and is dependent on the photodiode material. For example, and InGaAs detector has a shunt resistance on the order of 10 MΩ while a Ge detector is in the kΩ range. This can significantly impact the noise current on the photodiode. For most applications, however, the high resistance produces little effect and can be ignored.

Series Resistance
Series resistance is the resistance of the semiconductor material, and this low resistance can generally be ignored. The series resistance arises from the contacts and the wire bonds of the photodiode and is used to mainly determine the linearity of the photodiode under zero bias conditions.

Common Operating Circuits

Reverse Biased DET Circuit
Figure 2: Reverse-Biased Circuit (DET Series Detectors)

The DET series detectors are modeled with the circuit depicted above. The detector is reverse biased to produce a linear response to the applied input light. The amount ofphotocurrent generated is based upon the incident light and wavelength and can be viewed on an oscilloscope by attaching a load resistance on the output. The function of the RC filter is to filter any high frequency noise from the input supply that may contribute to a noisy output.

Reverse Biased DET Circuit
Figure 3: Amplified Detector Circuit

One can also use a photodetector with an amplifier for the purpose of achieving high gain. The user can choose whether to operate in Photovoltaic of Photoconductive modes. There are a few benefits of choosing this active circuit:

  • Photovoltaic mode: The circuit is held at zero volts across the photodiode, since point A is held at the same potential as point B by the operational amplifier. This eliminates the possibility of dark current.
  • Photoconductive mode: The photodiode is reversed biased, thus improving the bandwidth while lowering the junction capacitance. The gain of the detector is dependent on the feedback element (Rf). The bandwidth of the detector can be calculated using the following:

Equation 5

where GBP is the amplifier gain bandwidth product and CD is the sum of the junction capacitance and amplifier capacitance.

Effects of Chopping Frequency

The photoconductor signal will remain constant up to the time constant response limit. Many detectors, including PbS, PbSe, HgCdTe (MCT), and InAsSb, have a typical 1/f noise spectrum (i.e., the noise decreases as chopping frequency increases), which has a profound impact on the time constant at lower frequencies.

The detector will exhibit lower responsivity at lower chopping frequencies. Frequency response and detectivity are maximized for

Photoconductor Chopper Equation

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Posted Comments:
Poster: bdada
Posted Date: 2011-11-17 15:29:00.0
Response from Buki at Thorlabs: Thank you for your feedback. We can provide the calibrated version of the SM05PD1A. We will contact you regarding a quote.
Poster: gert
Posted Date: 2011-11-17 15:09:23.0
Can you give us a price for a calibrated and mounted FDS100 Si photodiode, type SM05PD1A ? Thank you, Gert Raskin
Poster: jjurado
Posted Date: 2011-02-24 14:33:00.0
Response from Javier at Thorlabs to rjaculbia: Thank you for contacting us with your request. We currently do not offer mounts or adapters for easily mounting the calibrated photodiodes. However, we can offer these already mounted in SM05 and SM1 compatible tubes with SMA or BNC output connectors as special items. Please visit the link below: http://www.thorlabs.com/NewGroupPage9.cfm?ObjectGroup_ID=1285 I will contact you directly to get information about your selection.
Poster: rbjaculbia
Posted Date: 2011-02-24 01:04:07.0
hi, how do we mount these diodes in a setup? can this be mounted using the s1lm9? Thanks
Poster: apalmentieri
Posted Date: 2010-01-20 15:33:04.0
A response from Adam at Thorlabs: The calibration data is in the form of an excel data table with a wavelength resolution of 10nm. When calibrating these diodes, we do not use fiber coupling methods. We use a monochromator with an output beam diameter of 1.7mm so not to overfill the aperture. The accuracy of +/-5% is a tolerance that includes any measurement errors, for instance shot noise and johnson noise from the detector, that must be taken into account while calibrating the diode to NIST traceable standards.
Poster: markus.blaser
Posted Date: 2010-01-20 11:05:25.0
Few questions with respect to FGA21-CAL: In which form is the calibration data availabe: Data Table ? Wavelength resolution ? What is the optical coupling method used for the calibration procedure: Butt Fiber / Angled Fiber or other coupling technique ? Why is the accuracy only +/- 5%, when the detector is calibrated against a NIST traceable reference detector ?
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Si Photodiodes with NIST Traceable Calibration

Two NIST traceable calibrated Si photodiodes are available from stock. Si photodiodes are sensitive across the visible and into the near infrared spectrum. The FDS100-CAL and FDS1010-CAL are both large area Si photodiodes and are packaged in a can and on a square ceramic substrate respectively. For detailed information about their specifications please see the Specs tab.

FDS100-CAL Responsivity Data,
FDS1010-CAL Responsivity Data

Item #WavelengthActive AreaRise/Fall
Timea
NEPbDark CurrentPackageVbias,maxPin
Configuration
FDS100-CAL 350 - 1100 nm 3.6 x 3.6 mm 10 ns @ 20 V 1.2x10-14 W/Hz1/2 20 nA max (20 V) Ø0.36" Can 25 V FDS100-CAL Pin Diagram
FDS1010-CAL 400 - 1100 nm 9.7 x 9.7 mm 45 ns @ 5 V 5.5x10-14 W/Hz1/2 0.6 µA max (5 V) 0.45" x 0.52" Ceramic Wafer 20 V FDS1010-CAL Pin Diagram
  • RL=50 Ohms
  • At 900 nm
Based on your currency / country selection, your order will ship from Newton, New Jersey  
+1 Qty Docs Part Number - Universal/Imperial Price Available / Ships
FDS100-CAL Support Documentation FDS100-CAL Calibrated Si Photodiode, 350-1100 nm, 3.6 x 3.6 mm Active Area $146.60
Today
FDS1010-CAL Support Documentation FDS1010-CAL Calibrated Si Photodiode, 400-1100 nm, 9.7 x 9.7 mm Active Area $176.30
Today
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Ge Photodiodes with NIST Traceable Calibration
FDG03, FDG05 Responsivity

Two NIST traceable calibrated Ge photodiodes are available from stock. Ge photodiodes are sensitive in the near infrared spectrum from 800 - 1800 nm. The FDG03-CAL and FDG05-CAL are AR Coated for 1300 to 1550 nm and are packaged in a can and on a square ceramic substrate respectively. For detailed information about their specifications please see the Specs tab.

FDG03-CAL Responsivity Data,
FDG05-CAL Responsivity Data

Item #WavelengthActive AreaRise/Fall
Timea
NEPbDark CurrentPackageVbias,maxPin
Configuration
FDG03-CAL 800 - 1800 nm Ø3 mm 500 ns @ 3 V 1.0x10-12 W/Hz1/2 4.0 µA max (1 V) Ø0.36" Can 3 V FDG03-CAL Pin Diagram
FDG05-CAL 800 - 1800 nm Ø5 mm 220 ns @ 5 V 4.0x10-12 W/Hz1/2 40 µA max (3 V) 0.275" x 0.310" Ceramic Wafer 5 V FDG05-CAL Pin Diagram
  • RL=50 Ohms
  • At 1550 nm
Based on your currency / country selection, your order will ship from Newton, New Jersey  
+1 Qty Docs Part Number - Universal/Imperial Price Available / Ships
FDG03-CAL Support Documentation FDG03-CAL Calibrated Ge Photodiode, 800-1800 nm, Ø3.0 mm Active Area $271.00
Today
FDG05-CAL Support Documentation FDG05-CAL Calibrated Ge Photodiode, 800-1800 nm, Ø5.0 mm Active Area $374.00
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InGaAs Photodiode with NIST Traceable Calibration
M01 Reflection

One NIST traceable calibrated InGaAs photodiode is available from stock. InGaAs photodiodes are sensitive in the near infrared spectrum from 800 to 1700 nm. The FGA21-CAL has a PIN structure that results in fast zero bias Rise / Fall times. For detailed information about its specifications please see the Specs tab.

FGA21-CAL Responsivity Data

Item #WavelengthActive AreaRise/Fall
Timea
NEPbDark CurrentPackageVbias,maxPin
Configuration
FGA21-CAL 800 - 1700 nm Ø2 mm 66 ns @ 0 V 3.0x10-14 W/Hz1/2 200 nA max (1 V) Ø0.36" Can 3 V FGA21-CAL Pin Diagram
  • RL=50 Ohms
  • At 1550 nm
Based on your currency / country selection, your order will ship from Newton, New Jersey  
+1 Qty Docs Part Number - Universal/Imperial Price Available / Ships
FGA21-CAL Support Documentation FGA21-CAL Calibrated InGaAs Photodiode, 800-1700 nm, Ø2.0 mm Active Area $356.00
Today
Add To Cart
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