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R3L1S4P - Positive 1951 USAF Wheel Pattern Test Target, 3" x 1" 
R3L1S4P - Positive 1951 USAF Wheel Pattern Test Target, 3in x 1in
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R3L1S4P
Positive 1951 USAF Wheel Pattern Test Target, 3in x 1in
Part Number: R3L1S4P - Ask a technical question Ask a technical question.
Weight: 0.10 lbs / Each
Available / Ships: Today
RoHS: RoHS Compliant
Price: $200.00
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R3L1S4P Support Documentation
 
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Product Summary:
Features
  • Ideal to Determine the Resolution of an Optical System
  • 3” × 1” Target for Measuring Resolution Across Image
  • Conforms to MIL-S-150A Standard
  • Chrome-Plated on Glass Substrates
  • Positive Wheel Pattern Test Target

Thorlabs’ R3L1S4P is a positive 3" x 1" resolution test target made from plating chrome on a glass substrate. The 3" x 1" wheel pattern targets have 9 USAF 1951 targets, each with 6 groups (+2 to +7) to also offer a maximum resolution of 228.0 line pairs per millimeter. The R3L1S4P is made at our semiconductor device production facility in Jessup, Maryland. We use contact photolithography with a mask aligner to define the pattern on the glass substrate. Once the pattern is defined, we then chemically etch the substrates and clean them in a class 100 cleanroom. The finished device is then checked with a critical dimension (CD) tool that is calibrated to NIST-traceable standards.

Specifications
  • Max Resolution: 228.0 line pairs/mm
  • Flatness: <50 µm
  • Design: Chrome-on-Glass
  • Substrate: Soda Lime Glass
  • Chrome Thickness: 0.120 µm
  • Substrate Thickness: 0.06” (1.5 mm)

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